Scanning electron microscopy (SEM) analysis
Scanning electron microscopy (SEM) is an advanced imaging technique that provides high-resolution images of material surfaces. It is widely used in industry and science to analyze the structure and composition of samples at the nanoscale. Its importance is growing with the rise of nanotechnology and complex materials.
What is scanning electron microscopy?
Scanning electron microscopy (SEM) is an advanced imaging technique that allows the observation of samples at the nanoscale with a resolution far superior to that of optical microscopy. This method relies on the use of an electron beam to analyze the surface of a material and deduce its morphological and structural properties.
How Scanning Electron Microscopy Works
The principle of SEM is based on the interaction between an electron beam and the sample being analyzed. Here are the main steps of the process:
- Electron production : An electron gun generates a beam of electrons focused on the sample.
- Surface scanning : The beam is directed onto the sample surface in a precise scanning pattern.
- Sample-electron interaction : These interactions produce signals (such as secondary electrons or backscattered electrons) that are captured and transformed into an image.
- Image acquisition and analysis : The image obtained allows the morphology, texture and composition of the sample to be studied.
Technical characteristics of the MEB / SEM
- Resolution : nanometer (1-10 nm depending on the instrument and sample)
- Magnification : up to 500,000x
- Electron sources : tungsten filament, field emission cathode
- Detector types : secondary electrons (SE), backscattered electrons (BSE), energy dispersive spectrometry (EDS)
- Analysis environment : high vacuum or low pressure for certain sensitive samples
For which matrices?
Scanning electron microscopy is suitable for many matrices, including:
Main industrial applications
Scanning electron microscopy MEB / SEM is widely used in many industrial and scientific sectors:
Léa Géréec
Technical and scientific advisor
